Short Course #2 Mapping Electronic and Chemical Properties at the Nanoscale
Cyril Guedj, Instructor
Please visit the Montreal meeting page for registration information. Early-Bird Registration rates are in effect until April 1, 2011. See a list of all Short courses offered at the Montreal meeting.
This short-course develops the possible characterization tools to measure electronic and chemical properties at the nanoscale. In the first part, we will discuss the characterizations involving an incident electron beam as a probe. Various microscopic techniques such as SEM, TEM, STEM, HRTEM-(V)EELS, nano-Auger, EDX will be presented and compared in term of spatial and energy resolution.
In the second part of the course, we will describe the possibilities and limitations of the characterizations involving photon probes, like XPS, XPEEM, UPS, spectral photoresponse, or TXRF.
In the third part, the techniques using ions as incident beam such as atom probe, SIMS, TOF-SIMS, LEIS, MEIS, RBS, and FIB will be detailed.
In the last part, the basic principles and limitations of techniques involving solid tips, like AFM, EFM, KFM, SSRM, SCM, and STM will be compared.
An overall comparison of the techniques will be finally presented, to provide a synthetic guide of existing tools to map electronic and chemical properties of solid-state materials with nanometric or sub-nanometric spatial resolution.
To benefit most effectively from this course, registrants should be familiar with material characterization, or have completed their first two years of a bachelor’s program in physics, chemistry, or engineering.
About the Instructor
Cyril Guedj received in 1992 his MS in material science from Caen University, his engineer diploma from ENSICAEN, and his MBA from Institute of Business Administration (IAE). He received his PhD with highest honors from the University of Paris in 1997 and spent three years in academic research on growth, characterization, and modelling of advanced materials and devices, followed by ten years of industrial R&D for optoelectronic and microelectronic applications. In 2008, he received the “habilitation to supervise research” (HDR) diploma.
Dr. Guedj was responsible of the nanocharacterization of SiGeC-based materials and devices, novel imaging systems and advanced interconnects. He is currently working on the development of advanced nano-characterization techniques in the Laboratory for Electronics and Information Technologies in Grenoble (France), which is part of the Micro and Nanotechnology Innovation Centre (http://www.minatec.com/). He co-authored more than 150 peer-reviewed publications or conference presentations and received the MRS award in 1997, the DARPA award in 1998, the CEA idea’s competition price in 2002, the technical achievement award from ADMETA conference in 2005 (Tokyo), and the Michel Lerme best paper award at the IITC conference in 2006.