Eddy Simoen is a senior researcher at IMEC, where he is currently involved in the study of defect and strain engineering in high-mobility and exitaxial substrates and defect studies in germanium and III-V compounds.
His research interests cover the field of device physics and defect engineering in general, with particular emphasis on the study of low-frequency noise, low-temperature behavior and of radiation defects in semiconductor components and materials. In 2013, he was nominated part-time professor at the Ghent University in the study on the impact of defects on semiconductor devices. Since 2013 he also holds a Visiting Professor position at the Institute of Microelectronics in Beijing.
In these fields, he has either authored or co-authored over 1,500 journal and conference papers, and 12 book chapters. Additionally, Simoen has organized many workshops and symposia. He is the lead organizer of the biannual High Purity Silicon Symposium at ECS meetings.