Call for Papers: JSS Focus Issue

JSS CoverThis special issue of the ECS Journal of Solid State Science and Technology focuses on defect characterization in semiconductor materials and devices. We especially welcome papers in the following domains:

  • Structural, chemical, electrical and optical characterization of extended defects in semiconductor nano-structures and materials
  • Electrical and optical characterization of point defects in semiconductor nano-structures
  • Semiconductor-device-based defect analysis
  • Impact of (extended) defects on device and circuit operation and yield
  • Defect characterization and control in hetero-epitaxial layers and nano-structures grown on Si, comprising Ge, SiGe, GeSn, III-V and III-nitrides
  • Ab initio calculations and TCAD of the electrical activity of (extended) defects in semiconductor materials and devices
  • Defect control and mitigation strategies during hetero-epitaxial deposition

Find out more!

Submission Deadline | Oct. 21, 2015
Papers accepted into this focus issue are published online within 10 days of acceptance.
The issue is created online an article at a time with the final article published in March 2016.

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