AiMES 2018 Topic Close-Up: Pits & Pores 8: Nanomaterials – Fabrication, Properties, and Applications

Deadline for Submitting Abstracts
March 16, 2018
Submit today!

Meeting speakerTopic Close-up #2

Symposium C02: Pits & Pores 8: Nanomaterials – Fabrication, Properties, and Applications

Symposium Focus: This symposium is aimed at the fabrication of all kinds of porous structures, their physical and chemical properties as well as their applications. It is a continuous attempt to integrate the diverse research in different fields such as localized metal corrosion, semiconductor electrochemistry, pore-filling, matrix materials, optical spectroscopy and characterization of magnetic properties in order to develop a highly transdisciplinary approach to the topic. Emphasis will be on pit and pore formation, porous-structure/surface-property relations, work relevant to the formation of advanced materials and their characterization, and applications of these materials in different areas of science such as biomedicine, energy storage and conversion, optics and magnetism.

The symposium brings together scientists from various research fields such as material science, electrochemistry, physics, chemistry, engineering and biology.

Featured Invited Speakers: Confirmed invited speakers include Sachiko Ono, Faculty of Engineering Kogakuin University; Hiroaki Tsuchiya, Osaka University; Taketomo Sato, Hokaido University; Leonid Tsybeskov, New Jersey Institute of Technology; Enrique Quiroga-Gonzalez, Benemérita Universidad Autónoma de Puebla

DISCLAIMER

All content provided in the ECS blog is for informational purposes only. The opinions and interests expressed here do not necessarily represent ECS's positions or views. ECS makes no representation or warranties about this blog or the accuracy or reliability of the blog. In addition, a link to an outside blog or website does not mean that ECS endorses that blog or website or has responsibility for its content or use.

Post Comments

Your email address will not be published. Required fields are marked *