Join us in celebrating the authors of the article, “A CMOS-Compatible Si Nanowire Resistance Temperature Sensor Based on Low-Temperature-Processed ZnO Layer,” for achieving top-read status in the ECS Journal of Solid State Science and Technology this week!
Authored by Darragh Buckley, Alex Lonergan, and Colm O’Dwyer, this innovative study explores the integration of a ZnO-coated silicon nanowire sensor fabricated through a CMOS-compatible process. With its excellent temperature sensitivity and low thermal budget, this work offers promising applications in the field of advanced microsystems and wearable electronics. (more…)