As ECS closes out March 2023, we celebrate four full issues of ECS Sensors Plus, the first 2023 issue on its way, and over 1,000 citations of content published in the journal to date!

ECS Sensors Plus, launched in January 2022, is the home for all content related to sensor technology. The journal leads and promotes scholarly communication and interactions among scientists, engineers, and technologists whose primary interests focus on materials, structures, properties, performance, and characterization of sensing and detection devices, methods, and systems, including sensor arrays and networks.

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Topic Close-up #3

Symposium: M01—Recent Advances in Sensors Systems 4

Deadline for submitting abstracts:
April 7, 2023

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Voting is now taking place for the position of ECS Sensor Division Treasurer. Biographical sketches and statements follow for the candidates nominated for the position. ECS division officers serve as volunteers.

We urge all ECS Sensor Division members to take part in this important election! Voting is open from September 1 through September 29.

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ECS is proud to announce that as of June 2022—following only its second issue—the Society’s new Gold Open Access Journal ECS Sensors Plus has been accepted for indexing in the Directory for Open Access Journals (DOAJ). The 19-year-old independent index includes almost 17,500 peer-reviewed, open access journals, and supports increasing the “visibility, accessibility, reputation, usage, and impact of quality, peer-reviewed, open access scholarly research journals globally, regardless of discipline, geography or language.”

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Deadline: July 24, 2022

ECS seeks to fill two Technical Editor positions in the Sensors Technical Interest Area (TIA). The first serves the wide range of sensors topics for ECS Sensors Plus. The second covers sensors topics for the Journal of The Electrochemical Society and ECS Journal of Solid State Science and Technology.

Nominees for these positions must possess and maintain scientific knowledge of the scope of the sensors topical interest area. Technical Editors are appointed for a minimum initial two-year term, renewable for additional terms, up to a maximum of 12 total years of service in this role. (more…)

In “Approaches for the Electrochemical Interrogation of DNA-Based Sensors: A Critical Review,” Miguel Aller Pellitero, Alexander Shaver, and Netzahualcóyotl (Netz) Arroyo-Currás reviewed the specific advantages of the electroanalytical methods most commonly used for the interrogation of DNA-based sensors.

Arroyo-Currás, ECS member and associate editor, Journal of the Electrochemical Society sensors technical area, provided more background information to the article in response to questions from the ECS Blog.

What are DNA-based electrochemical sensors?

These are measurement platforms that employ any form of DNA as the molecular recognition element. We must remember that electrochemistry is extremely sensitive (for example, there is significant work regarding stochastic detection of single entities like molecules, nanoparticles and whole cells and viruses) but lacks specificity; thus, relying on the molecular binding properties of DNA allows us to selectively detect molecules even in complex biological environments. (more…)

Accepting Submissions: December 26, 2019 – March 25, 2020

Submit your manuscripts to the ECS Journal of Solid State Science and Technology Focus Issue on Gallium Oxide Based Materials and Devices II.

About the focus issue

This issue of the ECS Journal of Solid State Science and Technology is the second in a series that aims to cover the growth, characterization, processing and device applications of Ga2O3. GaN and SiC based wide bandgap device technologies have matured and become limited by fundamental material properties. A new class of oxide wide band gap materials are emerging (gallium oxide and aluminum gallium oxide) that offer potentially improved figure of merit over GaN and SiC for power devices. The availability of Ga2O3 single crystals and epitaxial films with large area and excellent quality has led to renewed interest in this ultra-wide bandgap semiconductor for solar-blind photodetectors, sensors, and power electronics. (more…)

Join ECS San Francisco Section on December 12 for a presentation by Yijin Liu:

An Integrated Multi-modal X-ray Microscopy for Energy Material Science

Yijin Liu
Stanford Synchrotron Radiation Light Source
SLAC National Accelerator Laboratory
Menlo Park, CA

When: Thursday, December 12, 2019
Time: 1700h
Where: Sakura Bistro
388 9th Street, Oakland, CA 94607

Free participation; $35 flat fee for dinner 

RSVP to sfsectionecs@gmail.com (more…)

Long Luo, the featured speaker at ECS Detroit Section’s November 21 meeting, presents:

“Bubble-based electrochemical methods for detection of per- and polyfluoroalkyl substances (PFAS) in water”

Long Luo
Assistant Professor, Department of Chemistry
Wayne State University
Detroit, Michigan (more…)