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Sample Articles

Journal of The Electrochemical Society (JES)
Electrochemical and Solid-State Letters (ESL)
ECS Transactions (ECST)

© 2009 The Electrochemical Society. All rights reserved.
Volume 156

Behavior of Electrodeposited Cd and Pb Schottky Junctions on CH3-Terminated n-Si(111) Surfaces
S. Maldonado and N. S. Lewis
H123

Multimodal Physics-Based Aging Model for Life Prediction of Li-Ion Batteries
M. Safari, M. Morcrette, A. Teyssot, C. Delacourt
A145

Hydrothermal Synthesis and Characterization of Undoped and Eu-Doped ZnGa2O4 Nanoparticles
P. M. Aneesh, K. Mini Krishna, M. K. Jayaraj
K33

Characterization of the Conduction Mechanisms in Adsorbed Electrolyte Layers on Electronic Boards Using AC Impedance
L. C. Zou and C. Hunt
C8

Relation Between the Semiconducting Properties of a Passive Film and Reduction Reaction Rates
S. P. Harrington and T. M. Devine
C154
High-Capacity, Microporous Cu6Sn5-Sn Anodes for Li-Ion Batteries
L. Trahey, J. T. Vaughey, H. H. Kung, M. M. Thackeray
A385
Effect of LiCoO2 Cathode Nanoparticle Size on High Rate Performance for Li-Ion Batteries
M. Jo, Y.-S. Hong, J. Choo, J. Cho
A430

 

Electrochemical and Solid-State Letters Logo
© 2009 The Electrochemical Society. All rights reserved.
Volume 12

Eco-Efficient Synthesis of LiFePO4 with Different Morphologies for Li-Ion Batteries
N. Recham, M. Armand, L. Laffont, J-M. Tarascon
A39

High-Performance Flexible Miniature Fuel Cell
J. Wheldon, W.-J. Lee, D.-H. Lim, A. B. Broste, M. Bollinger, W. H. Smyrl
B86
Characteristics of Gadolinium Oxide Nanocrystal Memory with Optimized Rapid Therman Annealing
J.-C. Wang, C.-S. Lai, Y.-K. Chen, C.-T. Lin, C.-P. Liu, M. R. S. Huang, Y.-C. Fang
H202

 

ECS Transactions Logo
© 2007 The Electrochemical Society. All rights reserved.
Volume 11, Issue 1, 212th ECS Meeting, Oct. 7-12, 2007, Washington, DC

Distribution Profile of Specific Resistance in Polymer Electrolyte Membrane During Load Change for PEFC
S. Takaichi, H. Uchida, M. Watanabe
1505

© 2008 The Electrochemical Society. All rights reserved.
Volume 13, Issue 1, 213th ECS Meeting, May 18-23, 2008, Phoenix, AZ

Si Nanowire CMOS Transistors and Circuits by Top-Down Technology Approach
N. Balasubramanian, N. Singh, S. C. Rustogi, K. D. Buddharaju, J. Fu, Z. Hui, S. Balakumar, A. Agarwal, S. K. Manhas, G. Q. Lo, D. L. Kwong
201

 
 
 

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