212th ECS Meeting - Washington, DC |
October 7 - October 12, 2007 |
PROGRAM INFORMATION |
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E10 - Wide-Bandgap Semiconductor Materials & Devices 8 |
Electronics and Photonics/Luminescence and Display Materials/Sensor |
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Tuesday, October 9, 2007 |
Dupont Room, Terrace Level |
Optoelectronics 1 |
| Co-Chair(s): E. Stokes and J. Bardwell |
| Time | Abs# | Title and Authors |
| 14:00 |
1323
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Fabrication and Characterization of Ultraviolet Light Emitting Diodes with Nanometer Scale Compositionally Inhomogeneous Active Regions
A. V. Sampath, M. Reed, G. Garrett, E. D. Readinger, P. Shen, M. Wraback (US Army Research Laboratory), C. Chua, N. Johnson (Palo Alto Research Center), A. Usikov, O. Kovalenkov, L. Shapovalova and V. Dimtriev (Technologies and Devices International, Inc.)
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| 14:40 |
1324
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Wide-Band-Gap Nanowires: Growth Approaches, Structural Peculiarities and Device Prototyping
A. Davydov, N. Sanford, W. Boettinger, K. Bertness, A. Motayed, B. Nikoobakht, I. Levin, M. Vaudin, S. Sundaresan (NIST), R. Mulpuri (G Mason Univ), S. Noor Mohammad (Univ of Maryland), L. Robins and J. E. Maslar (NIST)
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| 15:20 |
1325
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Time-Resolved Photoluminescence of Wideband Gap Semiconductor Devices
G. Garrett, M. Reed, A. V. Sampath, P. Shen and M. Wraback (US Army Research Laboratory)
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| 16:00 |
1326
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Composition Tunable Quantum Dots as Light Emitters
L. Qu (Crystalplex Corporation)
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| 16:40 |
1327
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Device Challenges for Making a p-Side Down HVPE-Grown n-InGaN/p-GaN Single Heterostructure LED
M. Reed (US Army Research Laboratory), E. Readinger, P. Shen (Army Research Laboratory), M. Wraback (US Army Research Laboratory), A. Syrkin, A. Usikov and V. Dmitriev (Technologies and Devices International, Inc.)
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| 17:00 |
1328
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Bandgap Engineered MgZnO Nanocrystals for Photoluminescence Applications
L. Bergman, J. Huso and J. Morrison (University of Idaho)
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| 17:20 |
1329
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Localization of Oxygen Donor States in Gallium Nitride
K. C. Mishra (OSRAM SYLVANIA), P. Schmidt (Technical University of Darmstadt), S. Laubach (Eduard-Zintl-Institut,Technische Universität Darmstadt) and K. Johnson (Massachusetts Institute of Technology)
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| 17:40 |
1330
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Ultraviolet to Red Emission Nano-LEDs Based on One-Dimensional III-V Nitride Nanocolumns Grown on (111) Conductive Si Substrates
K. Kishino, A. Kikuchi, H. Sekiguchi and S. Ishizawa (Sophia University)
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Exhibit Hall, Concourse Level |
Poster session |
| Co-Chair(s): E. Stokes |
| Time | Abs# | Title and Authors |
| o |
1331
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Properties of Al-Doped ZnO Thin Films by E-Beam Evaporation
D. Kim, E. Jeong, I. Kim and S. Choi (Yonsei University)
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| o |
1332
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Electrical and Optical Characterization of CdSe Quantum Dot Active Layer Embedded in GaN Light Emitting Diode
C. C. Burkhart, M. Hodge, K. Patel (University of North Carolina at Charlotte), J. Pagan (Dot Metrics Technologies) and E. Stokes (University of North Carolina at Charlotte)
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| o |
1333
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Simultaneously Enhancing Internal and Extraction Efficiencies of GaN-based Light Emitting Diodes Via Chemical-Wet-Etching Patterned-Sapphire-Substrate (CWE-PSS)
Y. Lee, C. Chiu (Department of Photonics, National Chiao Tung University), H. Kuo (Department of Photonics National Chiao Tung University), T. Lu, S. Wang (Department of Photonics, National Chiao Tung University), K. Nar, K. Lau (Photonics Technology Center, Department of Electrical and Electronic Engineering, The Hong Kong University of Science and Technology), Z. Yang (Future Chips Constellation & Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute), S. P. Chang (Future Chips Constellation & Department of Physics Applied Physics and Astronomy Rensselaer Polytechnic Institute) and S. Lin (Future Chips Constellation & Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute)
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| o |
1334
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Electrical Properties and Thermal Stabilities of B, Al, Ga and In-Doped ZnO Thin Films
J. An, J. Noh, C. Cho, I. Cho (Seoul National University), H. Jung (Kookmin University) and K. Hong (Seoul National University)
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Wednesday, October 10, 2007 |
Dupont Room, Terrace Level |
Optoelectronics 2 |
| Co-Chair(s): G. Hunter and P. Shen |
| Time | Abs# | Title and Authors |
| 08:00 |
1335
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Stability Effects of Reflective Mirror on GaN LED/Mirror/Si Via Wafer Bonding and laser Lift-Off Techniques
S. Huang (Engineering), R. Horng (National Chung Hsing University) and D. Wuu (Materials Science and Engineering)
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| 08:20 |
1336
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Enhancement of the Light Emissions from Ag Doped ZnO Thin Films by Post-Annealing Process in Air
E. Jeong, D. Kim, I. Kim and S. Choi (Yonsei University)
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| 08:40 |
1337
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Circular Transmission Line Model (CTLM) Analysis for Non-Linear VI Characteristics on MBE p-GaN
K. N. Patel, E. Stokes (University of North Carolina at Charlotte), J. Pagan (Dot Metrics Technologies), C. C. Burkhart, M. Hodge and P. Batoni (University of North Carolina at Charlotte)
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| 09:00 |
1338
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Reflectance-Anisotropy Study of ZnTe Around the E1 and E1+Δ1 Critical Points
J. R. Molina-Contreras, F. Villalobos-Piña and R. Tejo-Vázquez (Instituto Tecnológico de Aguascalientes)
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| 09:20 |
1339
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Study of the Thin-Film GaN-Based LEDs with TiO2/SiO2 Omnidirectional Reflectors and PEC Roughened Surfaces
C. Chiu (Department of Photonics, National Chiao Tung University), H. Kuo (Department of Photonics National Chiao Tung University), C. Lee (Department of Photonics, National Chiao Tung University), C. Lin (Department of Computer and Information Science, Polytechnic University), H. Huang, T. Lu, S. Wang (Department of Photonics, National Chiao Tung University) and K. Leung (Department of Computer and Information Science, Polytechnic University)
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Electronic devices and Sensors |
| Co-Chair(s): J. Brown and K. Mishra |
| Time | Abs# | Title and Authors |
| 10:00 |
1340
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MBE-Grown Ultrashallow AlN/GaN HEMT Technology
H. G. Xing, Y. Cao, T. Zimmermann, D. Deen and D. Jena (University of Notre Dame)
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| 10:40 |
1341
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Propagation and Shrinking of Shockley Stacking Faults in SiC PiN Diodes
J. D. Caldwell, R. Stahlbush, O. Glembocki, K. Hobart and K. Liu (Naval Research Laboratory)
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| 11:20 |
1342
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An Overview of Wide Bandgap SiC Sensor and Electronics Development at NASA Glenn Research Center
G. Hunter, P. G. Neudeck, J. Xu, G. Beheim, R. Okojie and L. Chen (NASA Glenn Research Center)
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| 11:40 |
1343
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GaN and ZnO-Based Sensors for Gas, Nuclear Materials and Chemical Detection
S. Pearton, F. Ren, B. Kang, H. Wang (University of Florida, Chemical Engineering), B. Gila (Univ.Florida), D. Norton, L. Tien (University of Florida), T. Chancellor, T. Lele, Y. Tseng (University of Florida, Chemical Engineering) and J. Lin (University of Florida)
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| 12:00 |
1344
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Real-Time Neutron Dtection by Gd-Doped HfO2 Diodes
M. L. Natta, A. Sokolov (University of Nebraska-Lincoln), J. Tang, Z. Wang (University of New Orleans) and J. Brand (University of Nebraska-Lincoln)
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| 12:20 |
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Intermission (40 Minutes)
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| 13:00 |
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Intermission (60 Minutes)
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| 14:00 |
1345
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In Situ Transmission Electron Microscopy of GaN pn Diode Degradation
M. E. Twigg, Y. Picard, N. Bassim, M. Mastro, C. Eddy Jr., R. Henry and R. Holm (Naval Research Laboratory)
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| 14:40 |
1346
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AlGaN/GaN HEMTs Fabricated on Selectively Grown Mesas on Si(111)
J. Bardwell, S. Haffouz, H. Tang, A. Kochtane, T. Lester, R. Wang and S. Rolfe (National Research Council)
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| 15:00 |
1347
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Effects of Source and Drain Electrode Materials on Oxide Thin Film Transistor
C. Kim, J. Park, S. Kim, I. Song, Y. Park, E. Lee and J. Lee (Samsung Advanced Institute of Technology)
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Materials and Characterization |
| Co-Chair(s): E. Stokes and J. Bardwell |
| Time | Abs# | Title and Authors |
| 15:40 |
1348
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Non-Destructive Analysis of Defects in Wide-Band-Gap Thin Films by Electron Channeling Contrast Imaging
Y. Picard, M. Twigg, J. D. Caldwell, C. Eddy, K. Liu, R. Stahlbush, M. Mastro, R. Henry, R. Holm and P. Neudeck (Naval Research Laboratory)
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| 16:20 |
1349
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Dislocation Nucleation in MOCVD GaN Films on Stepped and Unstepped 4H-SiC Substrates
M. E. Twigg, N. Bassim, Y. Picard, M. Mastro, T. Zega, J. D. Caldwell, R. Henry, C. Eddy Jr., R. Holm, P. Neudeck (Naval Research Laboratory), A. Trunek (OAI) and A. Powell (Sest, Inc.)
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| 17:00 |
1350
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Characterization of Bulk GaN Crystals Grown From the Solution at Moderate Pressure and Temperature
M. Murthy (George Mason University, Dept. of ECE), B. Feigelson (SAIC), R. Frazier, J. A. Freitas and M. Mastro (Naval Research Laboratory)
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| 17:20 |
1351
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Structural Characterization of the Rotation Domain of Aluminum Nitride During Sapphire Nitridation
H. Lee, J. Ha, T. Minegishi, H. Lee, S. Lee, H. Goto, S. Lee, M. Cho, T. Yao and S. Hong (Tohoku University)
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