Honolulu PRiME 2012 - Honolulu, Hawaii |
October 7 - October 12, 2012 |
PROGRAM INFORMATION |
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E1 - Solid State Topics General Session |
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Wednesday, October 10, 2012 |
310, Level 3, Hawaii Convention Center |
Solid State Topics Afternoon Session |
Co-Chairs: R. Todi and O. M. Leonte |
| Time | Progr# | Title and Authors |
| 14:00 |
2438
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Characteristics of Zinc Oxide Films Grown on Sapphire Substrates Using High-Energy H2O Generated by a Catalytic Reaction on Platinum Nanoparticles
K. Yasui, H. Miura, S. Satomoto, and T. Kato (Nagaoka University of Technology)
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| 14:20 |
2439
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Dielectric Constant Studies of BCN Thin Films
K. B. Sundaram and V. Todi (University of Central Florida)
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| 14:40 |
2440
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Effect of Wet Surface Treatments on Amorphous Silicon Anneal and Gate Breakdown
C. S. Tiwari, T. Guo, C. Breyfogle, J. Zhang, H. Mitro, L. Olmer, V. Kumar, D. Pohlman, and M. Rutte (Micron Technology Inc.)
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| 15:00 |
2441
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Ultrasonic Spray-Assisted Vapor-Deposition Method as a Cost-Effective and Environmental-Friendly Technology for Semiconductor and Dielectric Materials for Devices
S. Fujita, S. Katori, J. Piao, T. Ikenoue, and K. Kaneko (Kyoto University)
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| 15:20 |
2442
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UV-Visible Faraday Rotators Based on Rare-Earth Fluoride Single Crystals: LiREF4 (RE=Tb, Dy, Ho, Er and Yb), PrF3 and CeF3
V. Vasyliev, E. G. Villora (National Institute for Materials Science), Y. Sugahara (Waseda University), and K. Shimamura (National Institute for Materials Science)
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| 15:40 |
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Intermission (20 Minutes)
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| 16:00 |
2443
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The Characterization Study of Polycrystalline Silicon Grain Growth with Electron Backscatter Diffraction Patterns and Crystallinity
S. Yang, J. Chang, J. Lim, J. Shin, Y. Yoo, J. Kim, B. Chung, H. Choi, K. Hwang, and H. Kang (Samsung Electronics Co., Ltd.)
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| 16:20 |
2444
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Electrical Breakdown of Anodic Aluminum Oxide Films for Electrowetting Systems
M. Mibus, E. Nein, A. Sapkota, C. Knospe, M. Reed, and G. Zangari (University of Virginia)
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| 16:40 |
2445
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Ultrafast Carrier Dynamics in Green-Sensitive Organic Photodiodes
S. Sul, K. Lee, D. Leem, K. Kim, and H. Han (Samsung Advanced Institute of Technology)
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| 17:00 |
2446
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Single Chamber HFCVD Process for Growth of Diamond, Graphene and CNTs
S. Albin (Norfolk State University), R. Vispute, and A. Seiser (Blue Wave Semiconductors, Inc.)
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Kamehameha Exhibit Hall 3, Level 1, Hawaii Convention Center |
E1 - Poster Session |
| Time | Progr# | Title and Authors |
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2447
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The Systematic Study and Simulation Modeling on Dislocation Edge Stress Effects for Si N-MOSFETs
M. Liao, C. Chen, L. Chang, C. Yang (National Taiwan University), C. Hsieh (Industrial Technology Research Institute), and M. Lee (National Taiwan Normal University)
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| o |
2448
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The Investigation on the Relaxation of Intrinsic Compressive Stress in CMOS Transistors by Additional N IMP Treatment and AFM-Raman Stress Extraction
M. Liao, C. Chen, L. Chang, C. Yang (National Taiwan University), C. Hsieh (Industrial Technology Research Institute), and M. Lee (National Taiwan Normal University)
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| o |
2449
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Plasmonic Color Filters for OLED by Laser Interference Lithography
J. Park (Korea University), Y. Do (KAIST), B. Hwang (Korea University), K. Choi (KAIST), and B. Ju (Korea University)
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| o |
2450
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Hot Carrier effects by Gate Induced Drain Leakage Current
K. Kim (Samsung Electronics Co.), C. Han, J. Lee, D. Kim, H. Kim (Sungkyunkwan University), H. Lee (Samsung Electronics Co.), and B. Choi (Sungkyunkwan University)
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2451
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Development of Visual Inspection System for Metal Surface with Multivariate Pattern Analysis
K. Shigyo, T. Matsumoto, K. Sakiyama (Mitsubishi Electric Corporation), and H. Kobayashi (Mitsubishi Electric METECS)
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| o |
2452
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Effects of Tungsten Composition Ratio on the Properties of W-In-Zn-O Films Deposited by RF Magnetron Sputtering
G. Heo (Korea Institute of Industrial Technology), B. Oh (LINKLINE INC), J. Park (Korea Institute of Industrial Technology), Y. Lee, Y. Lee, and D. Shin (Chosun University)
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2453
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Fabrication of n-type Semiconductive Polycrystalline Diamond by Incorporating Phosphorous Atoms
A. Nakahara, H. Naragino, K. Yoshinaga, S. Tanaka, and K. Honda (Yamaguchi University)
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| o |
2454
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Carrier Transport Mechanism at Metal/Amorphous Gallium Indium Zinc Oxide Interfaces
S. Kim, C. Choi, and H. Kim (Chonbuk National University)
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| o |
2455
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Glowth of AlN Single Crystals by Sublimation Method
Y. Oshima, M. Nakamura (National institute for materials science), Y. Masa (Sumitomo Metal Mining Co., Ltd.), E. G. Villora, K. Shimamura (National Institute for Materials Science), and N. Ichinose (Waseda University)
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